Primionics supports semiconductor and electronics engineering teams in India with precision source-measure instrumentation, low-current and leakage measurement, RF and mixed-signal validation, automated test and data acquisition, software assurance and cleanroom monitoring. The portfolio spans wafer-level I–V and breakdown characterisation, device and component validation, reliability studies, repeatable laboratory automation and contamination-sensitive manufacturing environments.
Leakage and sub-nanoampere measurements depend on the complete measurement path: guarding, shielding, low-leakage cabling, settling behaviour, fixture cleanliness and appropriate instrument ranges. Instrument sensitivity alone does not guarantee a credible low-current result.
Parallel characterisation requires synchronized channels, stable common returns, controlled switching and repeatable sequencing so channel-to-channel variation is not mistaken for device behaviour.
Contamination-sensitive fabrication, assembly, inspection and packaging depend on controlled airborne-particle levels, verified airflow and filtration performance, with measurement appropriate to the process area.
SMU-based I–V, leakage, breakdown, switching and reliability measurements for wafers, test coupons, packaged devices and materials, with range, compliance, timing and channel architecture selected around the device under test.
Oscilloscopes, spectrum and network analysers, signal sources, power instruments and probes for analog, digital, RF and power-electronics validation.
Instrument control, switching, synchronized acquisition, test sequencing and structured data capture for repeatable wafer, device and component characterisation.
Portable and remote particle counting, airflow measurement, aerosol generation and filter-integrity instrumentation for controlled environments.
Programmable sourcing and precision measurement for I–V sweeps, leakage, breakdown, pulsed operation and multi-channel device characterisation across development and reliability workflows.
Time-domain, frequency-domain, RF and mixed-signal instruments for circuit, device and subsystem validation.
Programmable power, electronic loads, power analysis and synchronized acquisition for power devices, converters and embedded electronics, from component evaluation through subsystem validation.
Programmable instrument control, switching, synchronization, device indexing and structured data export for repeatable characterisation and production-oriented measurement workflows.
Portable and remote particle counting, environmental trending, alarms and airflow measurement for controlled manufacturing and laboratory areas.
Requirements traceability, automated testing, static analysis, formal verification and embedded-security technologies for software-intensive semiconductor and electronics systems.
Guarded signal paths, low-leakage cabling, controlled settling and suitable fixtures help preserve picoampere- and nanoampere-level measurement integrity.
Synchronized SMU channels, stable common returns and controlled switching help reduce channel-to-channel variation in parallel measurements.
Sequenced sourcing, switching, wafer-map or device indexing and structured data export enable repeatable automated characterisation workflows.
Stored configurations, calibration status, test parameters and raw results support comparison across devices, wafers and test runs.