SIGLENT develops instruments for time-domain, frequency-domain, network, source, power and precision electrical measurements. The portfolio spans general laboratory work through high-bandwidth and high-resolution validation.
SIGLENTOscilloscopes, RF Analysis, Signal Generation & Precision Measurement in India
SIGLENT develops electronic, RF and power test instruments for waveform analysis, spectrum and network measurements, signal generation, device characterisation and programmable bench or automated test systems.
SIGLENT
SIGLENT Test & Measurement Support in India
Primionics provides SIGLENT application and product-selection support in India for oscilloscopes, spectrum and signal analysers, vector network analysers, RF and waveform generators, source-measure units, power supplies, electronic loads and digital multimeters.
Electronic, RF and power measurement platforms for development and validation.
Oscilloscopes, spectrum analysers, VNAs and signal sources cover embedded systems, RF components, wireless subsystems, power electronics and signal-integrity work, while SMUs, supplies, loads and DMMs address sourcing and precision electrical measurement.
LAN, USB and SCPI-based control across many instrument families supports repeatable bench procedures and integration into automated validation, characterization and production-test environments.
Oscilloscopes, RF instruments, signal sources and precision electrical test.
Digital Oscilloscopes
General-purpose, high-resolution and high-bandwidth oscilloscopes for mixed-signal, power and serial-bus analysis. Available platforms vary by bandwidth, resolution, memory, channel count and analysis capability for general-purpose and advanced measurements.
View productsSpectrum & Signal Analysers
Frequency-domain instruments for spectrum, signal-quality, modulation and EMI pre-compliance work. Instrument families support conventional spectrum work, real-time analysis, modulation measurements and EMI-oriented investigation.
View productsVector Network Analysers
Benchtop and portable VNA platforms for component, cable, antenna and network measurements. VNA configurations address component, cable and antenna characterisation across laboratory, production and field environments.
View productsSignal & Waveform Generators
Function, arbitrary and RF signal generators for stimulus, modulation and complex waveform generation. Sources provide standard functions, arbitrary waveforms, modulation and RF stimulus for design verification and automated test.
View productsSMU, Power Supplies & Loads
Source-measure units, DC power supplies and electronic loads for device and power-electronics testing. Programmable source and load products support device characterisation, battery testing, converter evaluation and production fixtures.
View productsDigital Multimeters
Bench multimeters for precision voltage, current, resistance and general electrical measurement. Bench meters provide repeatable electrical measurements with remote interfaces, data logging and automated-test integration.
View productsMeasurement workflows from circuit debug to RF and power validation.
Embedded and mixed-signal debug
Use oscilloscopes, protocol analysis and waveform generation to correlate analogue behaviour, digital timing and serial-bus activity during board bring-up and firmware validation.
RF and microwave characterisation
Use spectrum analysis, vector network analysis and RF signal generation to evaluate transmitters, receivers, filters, amplifiers, cables, antennas and wireless subsystems.
Power electronics and energy systems
Combine oscilloscopes, programmable sources, electronic loads, SMUs and DMMs for converter, battery, charger, motor-drive and power-rail measurements.
Automated laboratory and production test
Use remote interfaces and SCPI control to integrate measurement, stimulus and sourcing instruments into repeatable engineering and manufacturing test sequences.
Select instruments around bandwidth, resolution, dynamic range and automation requirements.
Time-domain performance
Match analogue bandwidth, sample rate, ADC resolution, memory depth, channel count and probe architecture to the fastest and smallest signals that must be resolved.
RF measurement performance
Select spectrum and network instruments by frequency range, displayed noise floor, phase noise, dynamic range, real-time bandwidth and the S-parameter or modulation measurements required.
Source and power capability
Define voltage, current, power, transient response, sourcing/sinking behaviour and measurement accuracy before choosing power supplies, loads or source-measure units.
Automation and repeatability
For automated systems, consider SCPI command coverage, LAN/USB connectivity, trigger coordination, data transfer and the repeatability of scripted measurement sequences.
SIGLENT selection and application questions.
When is a 12-bit oscilloscope preferable to an 8-bit oscilloscope?
A 12-bit acquisition system provides finer vertical resolution and is useful when small signal detail, ripple or noise must be measured in the presence of larger waveform components.
What is the difference between a spectrum analyser and a vector network analyser?
A spectrum analyser measures signal power versus frequency, while a VNA characterises the magnitude and phase of transmitted and reflected signals to determine S-parameters of RF networks and components.
When should an SMU be used instead of a bench power supply?
An SMU is appropriate when sourcing and precision measurement must occur on the same terminal pair, such as I–V sweeps, semiconductor characterisation and low-current device testing.
Can SIGLENT instruments be integrated into automated test systems?
Many SIGLENT instrument families provide remote interfaces and SCPI control suitable for scripted validation, laboratory automation and production-test integration.
Which instruments are relevant for EMI pre-compliance work?
A suitable spectrum or signal analyser, near-field probes, LISN or other coupling hardware and application-appropriate software can form an EMI pre-compliance measurement setup.
What should be specified for power-electronics measurements?
Key requirements include voltage and current range, isolation, bandwidth, switching frequency, probe architecture, transient conditions and whether programmable source/load operation is required.